Showing results: 826 - 840 of 976 items found.
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HDXZ-270kVA/270kV -
HD Power Test Equipment Co.ltd
HDXZ-270kVA/270kV Variable Frequency AC Resonant Test System is applied for AC dielectric test for electric equipment.1. 10kV/300mm2 cable 3km AC withstand test,capacitance≤1.1265uF,test frequency:30-300Hz, test voltage 22kV, test time 5min;2. 35kV/300mm2 cable 1km AC withstand test,capacitance≤0.1945uF,test frequency:30-300Hz, test voltage 52kV, test time 60min;3. 110kV/630mm2 cable 0.2km AC withstand test,capacitance≤0.0368uF,test frequency:30-300Hz, test voltage 128kV, test time 60min;4. 110kV/63000kVA Transformer AC withstand test,capacitance≤0.02uF,test frequency:30-300Hz, test voltage below 160kV, test time 1min;5. GIS 110kV, Switching busbar and other substation equipment, AC withstand test,test frequency:30-300Hz, test voltage below 265kV, test time 5min
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BK9024 -
BaKo Co., Ltd
If you need to test cellphones, the BaKo Type BK9024 is fast and switches between up to 8 phone chambers at once, making it a great choice for quality control on your production line.
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6TL Engineering
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
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eBIRST -
Pickering Interfaces Ltd.
The eBIRST toolset consists of three different tools that support 200-pin LFH, 78-pin and 50-pin connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence. These tools work by measuring the path resistance at the switching system external connectors using four-wire measurements, quickly establishing whether the path is good, has increased resistance or has failed. Below are links to various eBIRST tool information:
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Keithley 700 Series -
Tektronix, Inc.
The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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H391 Series -
Howell Instruments, Inc.
• Tests thermal switches and continuous-wirefire detection systems with precision • Is a solid-state device designed to be an effective and dependable tester • Features a user-friendly design that requireslittle training for new users
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Alliance Support Partners, Inc.
Signal quality problems caused by mismatched impedance can result in intermittent measurements and faulty diagnostics. This is most often observed when transporting a test program from one system to another, such as re-hosting it from an older generation system to a new one. The primary root cause of the impedance mismatch is the signal path from the UUT to the measurement instrument. The switching system technology often is responsible for much of the distortion. The Signal Buffer Module (SBM) is designed to receive a signal from the UUT with high impedance output and accurately reproduced it at the output for delivery to the measurement instrument. The SBM output matches the 50 ohm input impedance of most measurement instruments and result in significantly reduced signal distortion.
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40-571-206 -
Pickering Interfaces Ltd.
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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40-571-204 -
Pickering Interfaces Ltd.
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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LDA-602EH -
Vaunix Technology Corporation
The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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ITC57300 -
Integrated Technology Corp.
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Reston Software, llc
We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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45-720A-751 -
Pickering Interfaces Ltd.
The 45-720A module is a 6U 16x16 RF Matrix suitable for switching frequencies to beyond 250MHz. The 45- 720A module is available in 50 and 75 Ohm versions with a choice of coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximises isolation and RF performance.
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45-720A-511 -
Pickering Interfaces Ltd.
The 45-720A module is a 6U 16x16 RF Matrix suitable for switching frequencies to beyond 250MHz. The 45- 720A module is available in 50 and 75 Ohm versions with a choice of coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximises isolation and RF performance.
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Pickering Interfaces Ltd.
Pickering's 6U high-density matrices are suitable for switching frequencies to beyond 250MHz. The 45- 720A module is available in 50 and 75 Ohm versions with a choice of coaxial connectors. It is intended for the easy construction of high-performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture - this maximizes isolation and RF performance.
